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EDS analysis device - List of Manufacturers, Suppliers, Companies and Products

EDS analysis device Product List

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Dry SD Windowless EDS

Dry SD Windowless EDS

JSM-IT800 / A new exploration with windowless EDS analysis.

The Japan Electronics Corporation's Dry SD Windowless EDS Gather-X JED series is a windowless type EDS that can be mounted on the JSM-IT800. It enables stress-free EDS analysis from light elements to heavy elements! With carbon neutrality leading the way, material development has become increasingly important. For example, in battery materials, a wide range of analysis is required from light elements like Li to transition metals such as Ni, Co, and Mn. There is a growing need for more efficient and highly sensitive analysis of characteristic X-rays for the analysis of semiconductor materials and nanoparticles in catalysts. 〇 Features - High-sensitivity analysis across all energy ranges - High spatial resolution mapping - User-friendly and safe operation *For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices

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[Analysis Example by EDS] Bonding Interface of Cu Pad

[Analysis Example by EDS] Bonding Interface of Cu Pad

It is possible to view the distribution of each element in two dimensions! This can also be effective when analyzing multilayer samples.

We would like to introduce a case study of EDS analysis at the Cu pad interface. In qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds, the concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray. For intermetallic compounds, it is possible to estimate the formed compounds based on the calculated concentration ratios. Additionally, in line analysis, it is possible to profile the concentration distribution of each element along a specified line in the SEM image, allowing for the observation of changes in element concentration at the analysis location. 【Features of EDS Analysis】 ■ Qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds - Concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray - Intermetallic compounds can be estimated based on the calculated concentration ratios ■ Line analysis - Concentration distribution of each element along a specified line in the SEM image can be profiled - Changes in element concentration at the analysis location can be confirmed *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Contract Analysis

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